Ultra-high sensitivity DLTS bulk defect and interface level measurement device
Effective for analyzing defects and crystal defects! Equipped with interfaces for a wide range of cryostats.
The "DLS-83D/1000" is a measurement device capable of measuring bulk defects and interface states, including temperature, frequency scans, and C-V characteristics. The "DLS-1000" supports high-sensitivity measurements of bulk defects and interface states at the level of 10^8 cm³. It comes standard with a library for easy analysis. It features a unique system that employs a high-sensitivity analog/digital method (analog for measurement and digital for data processing) and is equipped with user-friendly software. 【Features】 ■ Capable of high-sensitivity contamination detection (2x10^8 atoms/cm³) ■ Equipped with a wide range of interfaces for cryostats ■ Capable of measuring temperature, frequency scans, and C-V characteristics ■ Over 100 units delivered worldwide, demonstrating extensive track record *For more details, please refer to the PDF document or feel free to contact us.
- Company：日本セミラボ 新横浜本社
- Price：Other
